TY - JOUR
T1 - A Technique of Electromagnetic Interference Measurements with High-Impedance Electric and Low-Impedance Magnetic Fields Inside a TEM Cell
AU - Das, S. K.
AU - Venkatesan, V.
AU - Sinha, B. K.
AU - Balaji, Uma
PY - 1990/1/1
Y1 - 1990/1/1
N2 - Transverse electromagnetic (TEM) cells are usually used to perform electromagnetic interference (EMI) measurements of equipment inside the cell in a plane wave-field environment. A newly developed technique of generating predominantly high-impedance electric or low-impedance magnetic fields inside a TEM cell for EMI measurements of relatively small printed circuit boards (PCBs), electronic devices, etc., is described. The technique simulates environments similar to the near-field EMI environment for intrasystem EMI/EMC (electromagnetic compatibility) studies. Variations of electric and magnetic fields, as well as impedances along the length of the cell, are given. The results indicate that a test region of reasonable size exists in the cell over which the field amplitudes are uniform within +or-1 dB.
AB - Transverse electromagnetic (TEM) cells are usually used to perform electromagnetic interference (EMI) measurements of equipment inside the cell in a plane wave-field environment. A newly developed technique of generating predominantly high-impedance electric or low-impedance magnetic fields inside a TEM cell for EMI measurements of relatively small printed circuit boards (PCBs), electronic devices, etc., is described. The technique simulates environments similar to the near-field EMI environment for intrasystem EMI/EMC (electromagnetic compatibility) studies. Variations of electric and magnetic fields, as well as impedances along the length of the cell, are given. The results indicate that a test region of reasonable size exists in the cell over which the field amplitudes are uniform within +or-1 dB.
UR - https://digitalcommons.fairfield.edu/engineering-facultypubs/184
UR - https://libraryapps.fairfield.edu/openurl?institution=01FUNI_INST&vid=01FUNI_INST:MAIN&sid=google&auinit=SK&aulast=Das&atitle=A%20technique%20of%20electromagnetic%20interference%20measurements%20with%20high-impedance%20electric%20and%20low-impedance%20magnetic%20fields%20inside%20a%20TEM%20cell&id=doi:10.1109%2FISEMC.1990.252790
U2 - 10.1109/ISEMC.1990.252790
DO - 10.1109/ISEMC.1990.252790
M3 - Article
JO - IEEE International Symposium on Electromagnetic Compatibility
JF - IEEE International Symposium on Electromagnetic Compatibility
ER -